How to measure and sort the resistivity of polysilicon material?

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In the production process of polycrystalline silicon ingot furnaces, measuring and sorting the resistivity of silicon material is a crucial step; only by accurately determining the resistivity distribution of the silicon material can doping with master alloys be carried out effectively to precisely control the resistivity of the silicon ingots. Currently, polycrystalline and single-crystalline factories basically use four-probe testers for the sorting of silicon materials. First of all, I would like to ask about the common classification levels for the resistivity of silicon materials. Are it necessary to have these three levels: 6–10, 10–20, and above 20? Secondly, if what is being purchased are solar cell wafers or IC fragments, how can one measure their resistivity range as accurately as possible? I have just entered this industry and would appreciate guidance from those with more experience.