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How to measure the bulk metal content in polycrystalline silicon?

2010-01-13View Original

Thread Content

Does anyone know how to measure the bulk metal content in electronic grade polysilicon? Hope everyone can share it. . . . . . . . . .
Reply #22010-01-14
It’s useless even if you know it. 1. You don’t have the equipment.; 2. You don’t have that technical level ; 3. Even if you make it, who will recognize it? It needs authoritative certification.
Reply #32010-01-19
What test is more appropriate? Is there no relevant appraisal department? I hope I can give you a detailed answer, thank you in advance. 2#yezi7414
Reply #42010-02-07
Generally, an experimental reduction furnace is used to reduce a section of silicon, and then a single crystal is pulled, and then mass spectrometry is performed.
Reply #52010-03-08
It seems that mass spectrometry cannot be done, the content is too low
Reply #62010-03-08
Using glow discharge mass spectrometry (GDMS).* * The non-ferrous metal and electronic materials analysis and testing center has the latest model of Element GD glow discharge mass spectrometer (GDMS) from Thermo Fisher Company in the United States. It is suitable for the analysis of impurities at the ppb level and above in metals. It can detect trace and ultra-trace impurity elements in 5N and 6N high-purity aluminum, copper, zinc, nickel, cobalt, and polysilicon. Telephone: 010-82241374 Website: www.ncatn.com
Reply #72010-03-24
Let me ask you a question upstairs: Compared with VG9000, does Element GD have a lower precision and accuracy for testing light mass elements? Thanks.

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