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Professional testing (XPS, TPR, TPD, ICP, BET, TG-DSC, SEM, TEM). Phone: 15977381032; results available promptly

2020-12-17View Original

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Phone and WeChat: 15977381032 QQ: 3095991442 1. Ultra-low-cost testing services for instruments such as TEM, SEM, NMR, ICP, XPS, BET, XRD, single crystals + analysis, nuclear magnetic resonance, in-situ XPS, spherical aberration electron microscopy, frozen electron microscopy, etc. 2. Testing, analysis, and certification for various large-scale instruments. It provides convenient, fast, and flexible one-stop services for universities, research institutions, enterprises, and others. III. Other service items: composition testing, formula analysis, elemental analysis, industrial diagnosis, analysis of unknown substances, etc. Reports can be issued, along with CMA and CNAS certifications. Test reports from **level laboratories can be issued. IV. Service areas: dozens of industries including polymer materials, fine chemicals, pharmaceuticals, food (seasonings), metal materials, gases, ores, water treatment, textiles, the environment, cosmetics, food and touch materials, agricultural products, metal materials, release agents, fluxes, dampening solutions, mineral processing chemicals, and more. V. Instruments: TEM, HRTEM, electron spin resonance spectrometers (ESR/EPR), SEM, EDX, X-ray photoelectron spectroscopy (XPS, UPS, VB-XPS, AES), XRF, PL/PLE, fluorescence lifetime and quantum yield measurements, TG-IR, TG-MS, Py-GC-MS (thermal decomposition gas chromatography), pyridine infrared spectroscopy, BET (mesoporous, macroporous), TPD/TPR, ICP-OES, ICP-MS, IC (ion chromatography), EA (elemental analysis), nuclear magnetic resonance (solid-state NMR, conventional NMR), HRMS, TOF, HPLC, LC-MS, GC-MS, TG-DSC, DSC, TGA, XRD, single crystal analysis, FTIR, particle size and zeta potential measurement, VSM (vibrating sample magnetometer), Raman spectroscopy, GPC, AFM, mercury porosimetry, TOC, UV-Vis spectroscopy, cone calorimetry, in-situ diffuse reflectance infrared spectroscopy, DMA, AAS, CD, EPMA, micro-IR spectroscopy, VOC analysis, synchrotron radiation (XAFS), photocurrent and impedance measurements, vector network analysis (ZND), contact angle measurement, etc

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