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Common faults and causes of flow integrators

2017-05-17View Original

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  Flow integrators are suitable for the measurement, accumulation, and control of flow rates for various liquids, steam, and general gases, as well as for the measurement, accumulation, and control of thermal energy in superheated steam and saturated steam. This product features multiple input signal options, allowing it to be connected to various differential pressure, pressure, and frequency-based flow sensors (such as Coriolis meters, orifice plates, vortex flow meters, turbine meters, V-cone meters, etc.). It also offers a range of compensation methods to choose from, including temperature compensation, pressure compensation, and a combination of both. Many customers encounter various types of faults during use. Below, we will introduce the three most common faults that occur with flow accumulators and their causes.   Fault 1: Unstable screen display with fluctuating numbers. The possible causes are as follows: 1. Poor grounding of the instrument; 2. Unstable power supply; 3. Open circuit in the shielding of the power transformer; 4. Faults in the reference voltage and negative power supply within the instrument; 5. Poor contact of the potentiometer; 6. Inadequate power filtering and voltage stabilization; 7. Problems with the room temperature compensation circuit and the reference power supply; 8. Damaged automatic zeroing circuit; 9. Poor soldering or poor contact in the connections, connectors, or components within the instrument; 10. Excessive noise inside the integrated operational amplifier.   Fault 2: The instrument output remains at 0mA. Causes: 1. The output transistor is damaged; 2. The output of the integrated operational amplifier is at a negative potential; 3. The power supply for the bridge circuit is damaged or its connections are open; 4. The emitter resistor of the output transistor or its leads are open; 5. The output wiring is open.   Fault 3: The instrument output remains at 10mA. Causes: 1. The transistor responsible for the instrument output is broken down; 2. The output of the integrated operational amplifier is at a positive potential, causing the transistor to conduct; 3. The integrated operational amplifier is damaged.   

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